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Keyword [Mechanical planarization]
Result: 41 - 56 | Page: 3 of 3
41. Fundamental studies of chemical mechanical planarization (CMP) processes of tungsten and copper
42. Characterization of chemical structure, morphology, and mechanical response of polyurethane surface domains as a result of exposure to common chemical mechanical planarization (CMP) environments
43. Chemical-mechanical planarization of copper/tantalum for microelectronic applications
44. Slurry flow, mass-transport, surface-kinetics and removal rate models for chemical-mechanical planarization
45. Mechanisms of chemical-mechanical planarization of copper/tantalum thin films using fumed silica abrasives
46. Electrochemical aspects of the chemical mechanical planarization of tungsten
47. Model slurries for chemical mechanical planarization of copper
48. Evaluation and characterization of polyurethane chemical mechanical planarization polishing pads
49. Process and mechanistic studies of the patterning of aluminum and copper thin films for multi-level metallization structures by chemical-mechanical planarization
50. Slurry mean residence time analysis and pad-wafer contact characterization in chemical mechanical planarization
51. Chemical mechanical planarization of copper/polyimide damascene structure with glycerol-based slurr
52. Material Characterization in the Electro-Analytic Approach for Applications in Chemical Mechanical Planarization and Electrochemical Energy Systems
53. Control of slurry flow, temperature and aggressive diamonds in chemical mechanical planarization
54. Fundamental Characterization of Chemical Mechanical Planarization Relating Tto Slurry Dispensing and Conditioning Metho
55. Effect Of Hydrogen Peroxide On Chemical Mechanical Planarization Of Cu/Ni Heterogeneous Microstructure Surface
56. Study On Weakly Alkali-polished Slurry And Control Mechanism Of Planarization For Integrated Circuit Cobalt Plugs
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