secondary ion mass spectrometry - Globe Thesis

Keyword [secondary ion mass spectrometry] Result: 1 - 20 \| Page: 1 of 2
1.	Impurity Diffusion Of Al And Si In The Supercooled Liquid State Of The Cu 44.25 Ag 14.75 Zr 36 Ti 5 Bulk Metallic Glass
2.	Secondary Ion Mass Spectrometry (sims) Analysis Of The Hybrid Reactor Surface Coating Composition Depth Profile Of Research
3.	The Morphology And Diffusion Mechanism Of Sulfur In Float Glass Process
4.	New Methods For Biointerface Analysis By Time-Of-Flight Secondary Ion Mass Spectrometry
5.	The Design And Implementation Of High Voltage Control System In Secondary Ion Mass Spectrometry
6.	Atomic Diffusion Of Al And Si In Cu-base Bulk Metallic Glasses
7.	The Segregations Of Boron And Niobium At Grain Boundaries In Microalloyed Steel And High-purity Nickel
8.	New Methods For Electrochemical Bioanalysis Based On Micro/Nanochannels
9.	Studyon Relative Sensitivity Factors Reproducibility Of Standard Samples In SIMS Quantitative Analysis
10.	Research On The Characteristics Of The Surface Chemical Compositions And The Influential Factors Of Atmospheric Aerosol Particles In A Typical Urban Area Of Beijing
11.	Effects Of Variability In Grinding Environment On Pulp Chemistry And Surface Chemistry Of Cu-Zn Ore
12.	Research On Peak Detection Method And Instrument Control Software For TOF-SIMS
13.	Study Of The Hydrogen Behavior In Tungsten And Elemental Distribution In The Corroded Layer Of ISG Glass Using Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS)
14.	Studies of interfacial behavior, surface morphology and tertiary structures of polysiloxane blends and copolymers at the air/water interface and their use as model systems to study ion formation mechanisms in secondary ion mass spectrometry
15.	Study of surfaces of semi-crystalline polymers by static time-of-flight secondary ion mass spectrometry
16.	A study of polymer tertiary structure in Langmuir monolayer films of poly(dimethyl siloxane) by time-of-flight secondary ion mass spectrometry, reflection-absorption Fourier transform infrared spectroscopy and high-resolution electron energy loss spectros
17.	Time-of-flight static secondary ion mass spectrometry as an analytical tool to obtain molecular information on and in organic materials
18.	Investigation of polymer phase behavior at heterogeneous polymer-polymer interfaces using secondary ion mass spectrometry
19.	Applications of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) to study interactions of genetically engineered proteins with noble metal films
20.	Time of flight secondary ion mass spectrometry enhancement of secondary ion formation from bulk organic materials using metal nanoparticles
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