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Keyword [Oxide Trapped Charge]
Result: 1 - 3 | Page: 1 of 1
1.
Radiation Effect Mechanism And Reliability In SOI MOSFETs
2.
Research On Ionization-induced Defects Of Gated Lateral Bipolartransistor In Hydrogen Ambient
3.
Radiation-induced mobility degradation in DMOS transistors
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