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Keyword [hot-carrier reliability]
Result: 1 - 9 | Page: 1 of 1
1.
Investgation Of Hot Carrier Reliability For BCD-based 70V Lateral DMOS
2.
Research Of Hot-carrier Degradation Mechanism And Lifetime Model For 600V LDMOS
3.
Analysis And Optimization Of Hot-carrier Degradation For U-shaped Channel SOI-LIGBT
4.
Drain leakage and hot carrier reliability of SOI MOSFET's
5.
Hot-carrier reliability of CMOS integrated circuits
6.
Hot-carrier reliability simulation and verification
7.
Hot-carrier reliability of silicon-on-insulator (SOI) MOSFETs and applications to non-volatile memories
8.
Fabrication And Hot Carrier Reliability Of Strained LDMOS
9.
Research Of Hot-carrier Reliability For Segmented Shallow Trench Isolation LDMOS
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