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Study Of The Technique Of Shape Measurement By Carrier Modulation In ESPI

Posted on:2009-05-22Degree:MasterType:Thesis
Country:ChinaCandidate:Z X HuangFull Text:PDF
GTID:2120360242995010Subject:Optics
Abstract/Summary:PDF Full Text Request
With the development of scientific progress and computer technology ,3-D shape measurement is widely used in scientific research, medical diagnosis, engineering design, traces of criminal investigations ,automatic on-line testing, quality control, robotics and many more industry.At the same time, the precision requires higher and higher. For example, auto body, aircraft fuselage, the hull vessels such as processing and manufacturing in the on-line measurement. Because of the important industrial applications ,3-D shape measurement technology has been got many attention by scientific researchers. As the topography measurement based on optical methods is of non-contact,whole field features ,they are always the research emphasis in the world .And many strategies have been developed based on various principles.Speckle interferometry technique is an important branch of optical measurement techniques,and because of its advantages of non-contact, high-precision measurement and whole field, it has been got many attention by scientific researchers.In the past three decades, in addition to the study of the inherent properties of laser speckle fields, various speckle measurement techniques are gradually developed and widely applied in different fields.With the laser technology, the computer technology and the imagery processing technology, the questions which appeared in the speckle interference can be resolved. For example various noises in the specklegram, phase unwrapping and other questions have been satisfactorily resolved. Therefore the speckle interference used in the object shape measurement also has developed and become a 3-D shape measurement method.In this dissertation, electronic speckle shape measurement by using Fourier transform is detailedly discussed. The main contents are described as the following:1. A review of development of the speckle interference measurement; Electronic speckle pattern interferometry principle and phase measurement technology in the speckle interferes is introduced2. A review of development of the shape measurement,Several shape measurement methods are introduced and gate of the projection method and speckle interferometry are mainly refered to3. Using the characteristic of the speckle interference measurement and Fourier transform. A setup of electronic speckle shape measurement by using Fourier transform is designed. Using the setup, ideal resul is obtained .In the end of the dissertation ,the image and the processing image in the experiment obtained.are given.
Keywords/Search Tags:ESPI, shape measurement, Fourier, Carrier
PDF Full Text Request
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