Analysis Of Nano-Micropore In Different Carbon Fiber By Small Angle X-Ray Scattering

Nowadays, Polyacrylonitrile carbon fiber(PAN-based CF)are widely used in many fields, such as advanced arms including nuke, strategically missile, secondary planet, aircraft, fighter plane and hidden fighter plane, because of which is the most crucial and imperative part of the reinforce of the composition. The flaws in the microstructure of CF are the main restriction of improving CF's performance. So quantitative characterization of CF's performance exactly is the foundation toinvestigat and improves the performance of carbon fiber. The process of producing PAN-based CF is very complex which induces many flaws. These flaws decrease the strength of fiber obviously. These flaws include the structure flaws between the chain of polymer, holes and pores, crackles in the superficial, dislocations in crystal, impurities and so on. The routine ways be taken usually to characterize the configuration of microspores in carbon fibers include TEM,SEM,BET, SAXS(small-angle x-ray scattering)etc.But the magnitude and the distribution of microvoids in CF can not be characterized by these ways quantitative. So it is still a urgent question to be resolved. The microspore features in carbon fiber are studied by small angle x-ray scattering technique. The results show that thought power of scattering and compared with angles. It show that fiber in China and Japan has some different in microprobe structure, Japan's fiber have more powerful scattering. Though compared with the change of the scattering power of two kinds of fibers, it shows the original fiber will translate its pore clement to the carbon fiber.