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Research On Evolution Of Goss Texture In Grain-oriented Silicon Steel During Cold Deformation And Primary Recrystallization

Posted on:2009-01-05Degree:MasterType:Thesis
Country:ChinaCandidate:Y Z LinFull Text:PDF
GTID:2131360308978897Subject:Materials science
Abstract/Summary:PDF Full Text Request
Grain-oriented Silicon Steel characterizes by a pronounced Goss texture ({110}<001> preferred crystal orientation). It has been widely used in electric power and electronic fields as a kind of important soft magnetic material. The products mainly apply to manufacture electrical transformer as core material. Preparation of Grain-oriented silicon steel needs for highly advanced equipment and technology, so that it has been considered as artwork of steels.The primary recrystallization microstructure and texture have vital effect on the development of highly oriented Goss texture during final annealing. In this experiment, the microstructure is observed with optical microscope, the X-ray texture analyses and EBSD technology are performed to the macroscopical texture and microcosmic grain orientation measurement of Grain-oriented Silicon Steel samples after cold rolling and recrystallization annealing. Results of this paper show that:(1) Normalized sample composes by single-phase ferrite grains with different size. Main texture components include {001}<110>,{112}<110>and Goss texture. Surface of sample covers with a weak texture layer contrasting with the subsurface and centre layer contain sharp {001}<110> and {112}<110> texture. All layers contain weak Goss texture. EBSD results show that Goss grains mainly locate at surface and subsurface in normalized sample. (2) Microstructure of cold rolled samples shows that the grains are elongated and fibered or disintegrated gradually. Texture of every layer all make up withαfiber texture andγfiber texture. Along with the increase of reduction,{001}<110> and {112}<110> texture ofαfiber texture enhance and the diffusion fall. Meanwhile, theγfiber texture increases and congregates to {111}<110> and {111}<112> orientation in surface layer,{111}<110> orientation in subsurface and centre layer. The {111}<112> texture in all layers of project 1# sample behaves more intensive than project 1#,s. (3) Vanishment ofαfiber texture,{111}<110> texture inγfiber texture and emergence of {111}<112> texture characterize the texture changement after primary recrystallization annealing. Well, sample with moderate reduction contains maximal Goss texture content. EBSD results show that Goss oriented grains mainly locate at surface layer after primary recrystallization annealing. With the annealing temperature rising, the content of Goss grains decreases while the grain size becomes lager than average size. (4) Project 2# cold rolled sample annealed under 800℃×3min contains the maximal Goss texture content and has the minimal grain size. Conclusions reveal 2# project sample is most suitable for developing secondary recrystallization.
Keywords/Search Tags:Grain-oriented Silicon Steel, texture, EBSD, normalization, cold deformation, primary recrystallization
PDF Full Text Request
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