Shanghai Ebit Spectrometer Simulation And Debugging

Highly charged ion (HCI) plays a key role in studies of atomic structure, many body interaction, relativistic effect and quantum electrodynamics, and also in diagnostics of high temperature plasmas.Electron beam ion trap (EBIT) is a device used both as an HCI source and as an HCI light source, which provides opportunities for various kinds of physics research related on HCIs. The HCIs created and trapped by EBIT, are confined to a cylinder-like space, which is typically 20mm high and 0.1 mm wide in diameter, which makes EBIT the perfect light source for spectrometers.The spectrometers in Shanghai EBIT laboratory include Mcpherson 225 Nova monochromator, flat field spectrometer, flat-crystal spectrometer and HpGe detector. This papers work concentrates on the following two parts:1. Using the optical CAD software 'Zemax', designed a toroidal mirror for the Mcpherson 225 Nova monochromator to replace the old spherical mirror. With the toroidal mirror the efficiency of the monochromator increases at least by the factor of 5.2. Upgraded the optical software Bray which is developed by Professor S. Huldt, making it possible to simulate variable line spacing gratings. Simulated the flat field spectrometer and calibrated the flat field spectrometer using a Mcpherson Inc. Model 642 x-ray source. Found a new way of calibrating the flat field spectrometer which is easier to use than normally used polynomial fitting method.