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The Test-equipment With U Disk Storage Function For Mechanical Parameters Acquisition System

Posted on:2013-08-30Degree:MasterType:Thesis
Country:ChinaCandidate:N SongFull Text:PDF
GTID:2248330371968353Subject:Measuring and Testing Technology and Instruments
Abstract/Summary:PDF Full Text Request
Due to its important role in the testing and analysis of mechanical parameters, thetest-equipment with U disk storage function for mechanical parameters acquisition systemplays important role in today’s space measurement systems. It can provide simulated signalsneeded for function test, performance testing, failure analysis and improvement reference ofthe space mechanical parameters acquisition system.This thesis mainly research on the U disk data storage method. And the test-equipmentwith U disk storage function for mechanical parameters acquisition system is designed withmodular design criterion. Three main parts are introduced as follows:(1) The power modules: Multiple voltages are designed for other modules, and the 27Vstable supply power to the acquisition system, as well as the 27±3 V supply power areespecially researched for partial test;(2) The signal source module: The FPGA is used as the main control circuit. Thesimulated fifty channel analogue signals are generated by one 12bit D/A converter and twostatic RAM. The signal wave can be changed by downloading different signal source to thestatic RAM.(3) Online reading and U disk storage module: The U disk storage function is realized byCH375, which is controlled by the single-chip microcomputer ATmega128. Online readingfunction is controlled by the FPGA. Two cascaded FIFO is used for data buffering. The dataof first FIFO is sent to U disk storage module, while the second one is controlled by PCcommand. This design has decreased the possibility of data losing and the data can becollected without the control of PC;The test-equipment for mechanical parameters acquisition system is proved validitythrough function test, and its function of U disk storage has provided a new way for nexttest-equipment designing.
Keywords/Search Tags:Test-equipment, ATmega128, CH375, FPGA, USB
PDF Full Text Request
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