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The Design Of Flight-Control Solid-State Memory And Key Technology Research

Posted on:2014-02-12Degree:MasterType:Thesis
Country:ChinaCandidate:Z GuoFull Text:PDF
GTID:2248330395491989Subject:Precision instruments and machinery
Abstract/Summary:PDF Full Text Request
As an important part of the measuring system, the solid-state memory can completelyand accurately record the various operating parameters of the aircraft flight test. It playbackand analysis of the data by hard recovery memory so that it can provide an importantscientific basis for the improvement and enhancement of the product. The designed solid-statememory is required in high pressure, high overload and high impact in view of the aircraftwork in a harsh environment. It must ensure the reliability of the work, record flightparameter information accurately, provide effective data interpretation for groundmaintenance.In this paper, the designed solid-state memory is based on mission requirements andperformance of technical indicators, made use of the design principles of modular, reliability,put forward the overall design, complete the acquisition and storage of the PCM code data ofthe flight control system, mainly accomplish the following work:(1) It adopts programmable logic device FPGA as the central control unit,, employNAND FLASH storage media to complete the flight control data storage via the RS-422communication interface. In the design, the hardware circuit and logic programming of solidstate memory is introduced.(2) It utilizes FLASH two-plane technology to write the PCM data and erase FLASH.The read stored data portion is designed to improve the efficiency of data reading. Finally,contrary to special work environment for the solid state memory, the protective measures areprovided for the storage module, and ensure a reliable recovery of the memory.(3) Introduce two operation modes of the solid-state memory, and the results arecompared and analyzed. Finally, a series of reliability tests to prove the reliability of its design.After a number of functional test, the results showed that the designed solid-statememory meet the design requirements and functions.In a harsh working environment, thememory has good performance, such as stable, effective and high reliability.
Keywords/Search Tags:Memory, FPGA, Two-Plane Technology, Reliability
PDF Full Text Request
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