Research On Optical Axis Detection Technology Of Quartz Crystal Based On Ellipse

Spectroscopic Ellipsometry is a widely used spectral technology,which also can be abbreviated to SE.This technology is base on the measurement of elliptically polarized light and named after it.When the light move towards to the surface of the sample,it will be reflected or transmitted or scattered cause by the influence of the light with the sample,in other word the polarization of the light will change because of the influence,which can be used to determine the optical characteristics(such as refractive index,dielectric constant etc.) of the sample.The polarized light acted as a probe and have no contact with the sample,so it will do no harm to the surface.In addition,the amplitude variation and the phase change can be obtained at the same time,which make sure the accuracy of the measurement,in conclusion,all these advantages above mentioned,make this technique play an important role in various fields like physics, mechanical, material, electronics, astronomy, chemistry, biology, astronomy, minerals and so on.The main content of this paper includes the following several aspects,first,the develop history and the present research situation were introduced,and kinds of ellipsometer,which were commonly used,were introduced,in addition,a reasonable prospect of the development trend of the technology of ellipsometry was proposed.Chapter two make a special introduction about the basic theory of the polarization optics,including such as the determination of the propagating direction of the wave and the refractive index of the ordinary and exordinary light, Finel reflection coefficients and so on.The theory of this part lay the foundation for the further research and deduction.Chapter three,the main principles of the ellipsometry technique was briefly summarized, Last but not the least,the key part of this dissertation was exhibited in chapter four and chapter five,With the development of polarizing technology,quartz crystal material are widely used and was often used to make the basic devices of all kinds of optical instruments,optical axis direction is an important parameter of the quartz crystal materials,the author put forward a feasible method to determine the optical axis direction of the quartz crystal,In chapter four,a new method was proposed to judge the weather its optical axis be perpendicular or be parallel to the polishing surface and if the deviation exists,how to make the deviating values corresponding to the deviation angle after the analysis and discussion of the reflection mode measuring result.This method has the advantages of fast speed, high accuracy and can be implemented on-line detection,so it has a very practical significance in daily industrial production and scientific research.At last,a method to judge the optical axis of the quartz waveplate by drawing the relationship curve between the phase difference and the rotation angle was introduced.