Monte Carlo Simulation Study On The Performance Of X, γ Ray Sensing Screen

For the industrial flaw detection, selecting the appropriate metal screen can shorten exposure time, improve the sensitization efficiency, and reduce the radiation dose to the professionals. This paper mainly uses the Monte Carlo method to simulate the photon(produced by 60 Co source,192 Ir source,200 KeV X machine and 4MeV acceleration)-electron coupled transportation process, and choose two screens in the experiment :one is copper, low atomic number, and the other is lead, high atomic number. Through the transportation process simulation,we can respectively find the relationship between the electron average energy and metal screen thickness,and the relationship between photon-electron coupling transportation efficiency and metal screen thickness, Further, compared with the experimental results, we’ll obtain the optimized thickness of the two metal screens and the intensifying factor of lead metal screens in the case of different flaw detectors, aimed at providing the sound basis for flaw detection to select appropriate metal screens.In the course of medical X-ray imaging, it is helpful of the appropriate fluorescent intensifying screen to increase the definition and reduce motion blur of the film. This paper studies the transportation process of the visible light through the fluorescent intensifying screen, and uses Monte Carlo(MC) method to calculate the relationship between the collection efficiency of emergent visible and the thickness of the intensifying screen.