High-Throughput Characterization Of Electromagnetic Technology And Instrumentation

Materials science is a laboratory-based complex systems science, so far, the de-velopment speed of the material largely depends on the experimental flux. Experiment traditional "trial and error" in can only handle a single or limited number of samples, inefficient, long development cycle, does not meet today’s science and technology devel-opment speed, high-throughput methods developed combination of material combina-tions can be accelerated filter material. Electromagnetic responsive materials in industry has an important role, with the improvement of science and technology development and application requirements, trends electromagnetic responsive material is good impedance matching, band width, thin, low density.When using high-throughput screening of electromagnetic responsive material, in-cluding the preparation and characterization of a combination of materials, preparation and characterization of screening material is dispensable. In this paper, the electro-magnetic response of materials characterization techniques and equipment for certain research. Since the dielectric material in different frequency bands do not exhibit the same characteristics, since the dielectric materials are used in the microwave band, can only use their microwave characterization, limitations due to diffraction limit, if you use long wave far, its space improved resolution is difficult to obtain. Firstly, we selected using a near-field scanning method dielectric material samples were characterized by the development of near-field scanning microscope contrast, comparing the advantages and disadvantages of different structures detection device, and finally determine the begin-ning of the bottom of the 1/4 wavelength coaxial resonator to the sample to be tested. Let the cavity in the resonant state, and then by the action of a coaxial resonator conductor disposed above the probe and the sample, when the probe and the sample is very close to or in contact when the resonator equivalent impedance will change. Record amount of change in the resonant cavity resonance frequency and quality factor by detecting means by image charge method to calculate the dielectric constant of the material. Firstly simulation designed 1.5GHz frequency resonator, and then design the probe-sample distance control scheme between. Finally, we set up the evanescent near-field scanning microscope, and then verify the feasibility of this distance control scheme by Sapphire dielectric constant testing.Evanescent near-field scanning microscope dielectric material characterization for efficient, will accelerate filter of electromagnetic responsive materials.