Ellipsometry - Globe Thesis

Keyword [Ellipsometry] Result: 1 - 20 \| Page: 1 of 5
1.	Study Of The Optical And Magneto-Optical Properties Of Some Optical-Electronic Functional Thin Films
2.	Theoretical And Experimental Study On The Heterodyne Interferometric Ellipsometry
3.	Measurement System For Determining The Thickness Of The Oxide Layer On The Silicon Sphere By Spectroscopic Ellipsometry
4.	Optical Frequency Space Interference Studies And Applications Of Electromagnetic Wave Propagation In The Film Structure
5.	Wide Spectrum Monitoring Technology And Its Application Of Thin Film Growth
6.	Study Of Data Processing For Single-wave Null Ellipsometry
7.	Studies Of Induced Defects And Its Optical Properties In Ion-implanted 6H-SiC
8.	Theoretical Study Of Measuring Gratings Parameters With Ellipsometry
9.	Research On Improving The Precision Of Ellipsometry-Measured Optical Parameters Of Thin Films
10.	Research On The Automatic Ellipsometer Based On Photometric & Unite Method
11.	Study Of Modeling And Measuring Of Optical Polarized Scattering From Surfaces
12.	The Study Of Inhibitory Capability Of Chitason And Its Derivatives In Sea Water
13.	Inversion And Measurement Of Optical Parameter Of DLC Film
14.	Ellipsometric Measurement Of Some Usual Optical Material (Film)
15.	Theoretical Study And Analysis Of Ellipsometer Method To Determine The Optical Film Parameters
16.	Film Thickness Measurement Based On Ellipsometry
17.	Study On The Optical Characteristics Of Interface Layer Of Deposition Diamond-like Carbon Films
18.	The Optical Detection And Data Acquisition System Of Ellipsometer Drived By LabVIEW
19.	Effects Of Oxide And Roughness Layer On The Polarization Characteristics Of Specular Reflection Of Micro-structure Surfaces
20.	Spectroscopic Ellipsometry Measurement Of Glass Transition Temperature Of Organic Small Molecular Thin Films
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