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Keyword [Spectroscopic ellipsometry]
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1. Measurement System For Determining The Thickness Of The Oxide Layer On The Silicon Sphere By Spectroscopic Ellipsometry
2. Optical Frequency Space Interference Studies And Applications Of Electromagnetic Wave Propagation In The Film Structure
3. Wide Spectrum Monitoring Technology And Its Application Of Thin Film Growth
4. Spectroscopic Ellipsometry Measurement Of Glass Transition Temperature Of Organic Small Molecular Thin Films
5. Study On Preparation And Properties Of Solution-processed IGZO Thin Film
6. Infrared Spectroscopic Ellipsometry Study Of Gan Epitaxial Films
7. Tbfeco Magneto-optical Thin Films And Performance Study
8. Silicon Nanocrystals And Ferroelectric Thin Films Spectroscopic Ellipsometry
9. Study Of The Optical Properties Of Metal Matrix Thin-film Structures
10. Study On Radio-Rrequency Reactive Magnetron Sputtering For The Single-Phased Ag2O Films For Optical And Magneto-optical Storage
11. Deposition Of Nanoscale Films And Ellipsomctry Study Of Their Optical Properties
12. Structure And Its Physical Effects In Hydrogenated Amorphous Silicon Thin Films
13. Experimental Study On The Optical Constants Of Typical Engineering Materials At High Temperature Using Ellipsometry
14. Optical Characteristics Of High K Materials Deposited By ALD
15. Quantum Molecular Dynamics Simulation Of Dielectric Function Of Solids And Its Temperature Dependence
16. In Situ Spectroscopic Ellipsometric Study On Anodization Of Aluminum In Oxalic Acid Solution
17. Study On Ellipsometry And Luminescent Properties Of Nanocrystalline Silicon Superlattice Films
18. Study On Variable Temperature Elliptical Polarization Spectra Of Dimensional Thyristor Nanocrystals
19. Preparation And Properties Of TiO 2 Thin Films On Their Optical Properties
20. Study On Elliptic Polarization Spectra Of Temperature - Dependent Titanium Dioxide And Lead Zirconate Titanate Thin Films
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