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Keyword [Atomic Force Microscopy(AFM)]
Result: 1 - 20 | Page: 1 of 2
1. Characterization And Tribological Properties Of Self-Assembled 3-Aminopropyltriethoxysilane-Rare Earth Composite Films
2. Lap Crystal And Mmtc Crystals Surface Morphology And Growth Mechanism
3. Research Of The Mechanism Of Nanofiltration Membranes With Organic Solvents
4. Study On The Morphology And Structure Of Polymer Composite Nanomaterials
5. Aggregated Behaviors, Morphology Of Polysaccharides Molecules Studied By Atomic Force Microscopy, And Preparation Of Polysaccharides/quantum Dots Multilayer Films
6. Chitosan Complexed Films Investigated By Atomic Force Microscopy (AFM)
7. Study On The Behavior Of Cationic Surfactant DDABDT Onto Human Hair Surface
8. Design And Synthesize Of Covalently Linked Organic-amino Acid Conjugated Compounds And SPM Study On Their Self-assembly Behaviors At Interface
9. The Langmuir-blodgett (lb), Two Amphiphilic Porphyrin Derivatives, The Nature Of The Film
10. Dna Assembled Their Fluorescence Properties Of The Gas-liquid Interface
11. The Preparation Of PLLA-MPEG Microbrushes For Protein Resistance
12. Machined Depth Model And Experimental Study Of AFM Tip-based Mechanical Machining Method
13. Preparation And Properties Of PVDF Ultrafiltration Membranes Modified By SiO2-GO Nanohybrid Particles
14. Investigation On Surface Modification Of Two-Dimensional Molybdenum Disulfide
15. Research On Properties Of Exocelluar Envelope Of Algae Based On Atomic Force Microscopy
16. Research On Surface Enhancement Raman Scattering Substrate With Gold Nano-particles And Grooves
17. Surfactant adsorption during collisions of colloidal particles: A study with atomic force microscopy (AFM)
18. Sum frequency generation (SFG) surface vibrational spectroscopy and atomic force microscopy (AFM) studies of the composition, structure, and mechanical behavior of polymers at interfaces
19. An in situ atomic force microscopy (AFM) investigation of tropoelastin-like peptide assembly at ordered interfaces
20. Characterization of polymer surfaces using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and atomic force microscopy (AFM)
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