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Keyword [BEEM]
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1. Ballistic electron emission microscopy and internal photoemission study on metal bi-layer/oxide/silicon, high-k oxide/silicon, and 'end-on' metal contacts to vertical silicon nanowires
2. Electrical and optical characterization and nanoscale patterning of gallium nitrogen arsenide synthesized by energetic beams
3. Comparative study of electrical properties of metal-monolayer-semiconductor junctions at macro and nano scales
4. Ultra low signals in ballistic electron emission microscopy
5. Nanometer scale electrical characterization of thin dielectric films
6. Theory of ballistic electron emission microscopy
7. The nature of the metal-semiconductor contact: Evidence of spatially variant energy barriers in metal-semiconductor contacts
8. Hot-electron effects in thin silicon dioxide films studied with ballistic electron emission microscopy
9. Ballistic electron emission microscopy and metallic band structure effects
10. Scanning tunneling microscopy and ballistic electron emission microscopy in metal-semiconductor applications
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