Keyword [Contact Resonance] Result: 1 - 2 | Page: 1 of 1 1.  Mechanical Characterization At The Nanoscale Based On Contact-resonance Atomic Force Microscopy 2.  Non-destructive Characterization Of Longitudinal Piezoelectric Coefficients In Thin Films By Piezoresponse Force Microscopy   <<First  <Prev  Next>  Last>>  Jump to

Globe Thesis Copyright © 2023. All Rights Reserved. | Privacy | Copyright | Contribute | About | Contact | RSS