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Keyword [grazing-incidence x-ray diffraction]
Result: 1 - 5 | Page: 1 of 1
1.
Structure Study Of GaN/Al
2
O
3
By High Resolution X-ray Diffraction
2.
In Situ Real-time Characterization Of Structure Change In The Thin Film Of Poly Octylfluorene When It Is Under Annealing
3.
Real-time Investigation Of Graphene Layer Growth With Synchrotron Radiation-based Dynamic Characterization Technique
4.
Optical Properties And Structyres Of Transparent Oxide Semiconductor Hfo
2
5.
Residual stress depth profiling using grazing incidence x-ray diffraction
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