Font Size:
a
A
A
Keyword [s-SNOM]
Result: 1 - 2 | Page: 1 of 1
1.
Investigating Optical Properties Of Two Dimensional Materials By Utilizing Scattering-Type Scanning Near-Field Optical Microscope(s-SNOM)
2.
Observation Of Plasmon In Topological Insulator Bi
2
Te
3
And Carrier Dispersion In Perovskite Film With S-SNOM
<<First
<Prev Next>
Last>>
Jump to
