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Keyword [Ferroelectric Thin Films]
Result: 1 - 20 | Page: 1 of 3
1.
Studies Of The Preparation And Properties Of (BI
4-X
LA
X
)TI
3
O
12
Powders,Ceramics And Thin Films Through Sol-Gel Method
2.
Fabrication Of Na
0.5
Bi
0.5
TiO
3
Ferroelectric Thin Films And Its Etching
3.
Study On Ferroelectric Thin Films Prepared By RF Magnetron Sputtering And Liquid Source Misted Chemical Deposition
4.
The Crystallization Behavior And Kinetics Of ABO
3
Type Ferroelectric Thin Films
5.
Influence Of Electrodes And Structural Transition Layers On The Dielectric And Pyroelectric Properties Of Ferroelectric Thin Films
6.
Fabrication And Surface Nanoscale Electrical Properties Of Perovskite Ferroelectric Thin Films
7.
Ferroelectric Thin Films Materials And Application For Dielectric Phase Shifters
8.
Theoretical Studies On The Polarization Properties Of Ferroelectric Thin Films
9.
Influence Of Structure Transition Layer On Statical And Dynamical Properties Of Ferroelectric Thin Films
10.
Preparation And Properties Of Bi
4
Ti
3
O
12
Thin Films For FFET
11.
Fabrication Of PZT Photosensitive Ferroelectric Thin Films And Researches On Mechanisms Of Photosensitivity
12.
Study On The Preparation And Properties Of (Ba,Sr)TiO
3
Ferroelectric Thin Films And (Ba,Sr)TiO
3
/YBa
2
Cu
3
O
7-δ
Ferroelectric/Superconductor Heterostructure By Pulsed Laser Deposition
13.
Preparing And Structure Investigation On Ferroelectric Thin Films By Sol-Gel
14.
Study On The Fabrication And Characteristics Of The Ferroelectric Thin Films For Ferroelectric Memories
15.
Theoretical Investigation On Properties Of Ferroelectric Thin Films With Dead Layer
16.
Theoretical Investigation On Physical Properties Of Size Effect Mechanism Of Ferroelectric Thin Films
17.
Preparation And Properties Investigation Of Mn-Doped BiFeO
3
Ferroelectric Thin Films
18.
Study On The Na
0.5
Bi
0.5
TiO
3
Ferroelectric Thin Films Doped With Strontium And Calcium
19.
Preparation And Characterization Of Capacitance Structures Of BVO Ferroelectric Thin Films
20.
Measurement Of Residual Stress In Ferroelectric Thin Films By Using X-ray Diffraction
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