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Keyword [atomic force microscopy]
Result: 81 - 100 | Page: 5 of 6
81. Probing Nanostructures for Photovoltaics: Using atomic force microscopy and other tools to characterize nanoscale materials for harvesting solar energy
82. Dynamic probing of compliant surfaces in liquid using intermittent-contact atomic force microscopy
83. Parallel studies of in vitro native collagen fibrillogenesis: Cold start, warm start and dialysis assembly pathways revealed by atomic force microscopy
84. Use of atomic force microscopy for characterizing damage evolution during fatigue
85. Single-Molecule Studies of Rad4-Rad23 Reveal a Dynamic DNA Damage Recognition Proces
86. Three-dimensional Atomic Force Microscopy Based On The Probe With Flared-tip
87. Research On Fast Image Scanning Method Of Atomic Force Microscopy
88. Mechanisms Of Energy Dissipation In Tapping Mode Atomic Force Microscopy
89. Design And Performance Analysis Of Low-noise Atomic Force Microscopy Scanning Head
90. Design And Implementation Of Vacuum Contactless Frequency Modulated Atomic Force Microscope System
91. Research On Atomic Force Microscope Image Blind Deconvolution Method Width Convolution Neural Network
92. Image Reconstruction For Fast Non-raster Scanning Atomic Force Microscopy Using Gaussian Process
93. Study On Microstructure And Properties Of Asphalt Based On Infrared Spectroscopy And Atomic Force Microscopy
94. Effect Of Emulsifier On Asphalt Performance And Adhesion Between Asphalt And Aggregate
95. Effects Of Solvent On The Noise Of Atomic Force Microscopy And Single-chain Elasticity Of Poly(2-ethyl-2-oxazoline)
96. Experimental Study On The Time Dependence Of Micro-nano Adhesive Contact Based On Atomic Force Microscopy
97. Atomic Force Microscopy Non-resonant Magnetic-drive Technology And Its Application In Micro/Nano Mechanical Measurement
98. Study On The Charge-discharge Behavior And The Interface Of Metal Anodes(Lithium/Zinc) In Organic Electrolytes
99. Study On The Micro Tribological Properties And Solid Lubrication Properties Of MXene
100. Research On Dual Tuning-Fork Atomic Force Microscopy For Linewidth Metrology
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