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Keyword [Bias Temperature Instability]
Result: 61 - 65 | Page: 4 of 4
61.
Design Of NBTI Effect Aging Monitoring Circuit For SRAM Array
62.
Test Analysis Of Threshold Voltage Drift Characteristics Of SiC MOSFET Devices
63.
Research On The Influence Of The Synergistic Effect Of BTI And Process Variation On The Reliability Of Integrated Circuits
64.
Research On Crosstalk In Half-bridge Structure Of SiC MOSFETs
65.
Reliability Characterization And Modeling Of 0.18μm BCD Process Power LDMOS
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