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Keyword [Electro-migration]
Result: 1 - 13 | Page: 1 of 1
1.
Study Of IC Local Defect And Its Related IC Functional Yield And IC Interconnects Electromigration
2.
Research For Signal Integrity In Deep Submicron IC Physical Design
3.
The Electro-migration Study For Al Interconnects
4.
.0.14 Micron Process Aluminum Interconnect Electromigration Reliability Improvement
5.
Technology And Optimization Of PVD Aluminum In 65nm Integrated Circuit Technology
6.
The Analysis And Research Of Cu Interconnection Failure
7.
Study On Stability Of ALSICU Process In IC Manufacture
8.
Research Of Ultra Deep Submicron SoC Embedded Reliability Failure Prediction Technology
9.
Electro-migration Of Silver Alloy Wire With Its Application On Bonding
10.
Lead-free Solder Joint Electromigration Induced Interface Compound Growth And Failure Research
11.
Research On The Reliability Of Electromigration In Solder Bump Of Flip Chip Packaging Under Multi-physics Coupling
12.
Digital Back-end Design Of USB TYPE-C Interface Chip With Optimizing Floorplan And Placement
13.
Research On Electro-migration Failure Of Flip Chip Under Electro-thermal-Structure Coupling
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