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Keyword [Interfacial passivation layer Interface-state density]
Result: 1 - 2 | Page: 1 of 1
1.
Interfacial Properties And Oxide Trap Capacitance Effect For GaAs MOS Devices With High-k Gate Dielectric
2.
Optimization Of Material And Processing For Interface Passivation Layer Of Ge MOS Devices With High-k Gate Dielectric
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