Keyword [Post-oxidation annealing] Result: 1 - 2 | Page: 1 of 1 1.  Investigation Of Electrical Properties Of SiC MOS Interface Modified By NH3 Plasma Post-oxidation Annealing 2.  Study On Effect Of Annealing Conditions On The Capacitance Characteristics Of MOS 4H-SiC/SiO2   <<First  <Prev  Next>  Last>>  Jump to

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