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Anisotropic Properties Of Epitaxial Iron Oxide Films And Heterostructures

Posted on:2012-10-26Degree:DoctorType:Dissertation
Country:ChinaCandidate:P LiFull Text:PDF
GTID:1111330362953797Subject:Materials Physics and Chemistry
Abstract/Summary:PDF Full Text Request
Ferrites, including half-metallic Fe3O4 and spin-filtering NiFe2O4, CoFe2O4 andγ–Fe2O3, are of vital importance in spintronics due to the high Curie temperature and simple structures. Polycrystalline Fe3O4 films, epitaxial Fe3O4 films, epitaxial ?–Fe2O3 films and fully epitaxial Fe3O4/ZnO and Fe3O4/Nb:SrTiO3 heterostructures were fabricated by using facing-target reactive sputtering. The structures and optical, magnetic and transport properties were analyzed systematically.It was found that the epitaxial growth of spinel Fe3O4 andγ–Fe2O3 can be realized by optimizing the deposition conditions such as single crystal substrates with small mismatch, smaller deposition rate and higher substrate temperatures. The magnetic and magnetotransport properties of the Fe3O4 films are governed by the antiferromagnetic coupling strength across the grain boundaries. Butterfly-shaped magnetoresistance (MR) in the epitaxial Fe3O4 films are closely related to the antiphase boundaries (APBs), and the low-field MR peaks at the coercivity of hysteresis loops and the high-field MR is linear to the magnetic field. The features of the low- and high-field MR were considered to be caused by the fact that the moments far away from APBs orient towards the direction of low magnetic fields and then those near the APBs align gradually at high fields. The magnetization of the epitaxialγ–Fe2O3 films with different thicknesses keeps the value of bulk (390 emu/cm3), and their coercivity increases with the film thickness.The anomalous four-fold symmetric anisotropic magnetoresistance (AMR) that increases with the magnetic field was observed in the epitaxial Fe3O4 films, which can not be explained by traditional AMR theory. It is supposed that the four-fold AMR in the epitaxial Fe3O4 films is related to the magnetocrystalline anisotropy and native growth defect APBs. At low fields, the moments primarily orient towards the applied magnetic field and the scattering is mainly caused by the small-polaron hopping between the uncoupled grains (spins) far away from APBs. While the magnetic field rotates in film plane, the moments far away from APBs always keep the same direction with the magnetic field. Therefore, the scattering far away from APBs is not influenced by the magnetocrystalline anisotropy, leading to the traditional two-fold symmetric AMR. At high fields, the scattering mainly focuses among the moments near the APBs. The magnetocrystalline anisotropy field modifies the alignment of the spins near APBs further when the magnetic field rotates in film plane, leading to the oscillating scattering possibility of electrons along the hard or easy axes, i.e. four-fold symmetric AMR.It was demonstrated that the transport mechanism of the Fe3O4 (111)/ZnO (0001) heterostructure is thermal diffusion/emission for T<30 K. The Schottky barrier of 0.51 eV (30 K) was found to form at the interface between Fe3O4 and ZnO. The spin polarization of the transport electrons from Fe3O4 to ZnO was determined to be 28.5%. AMR of 80% across the Schottky interface between the ferromagnetic Fe3O4 film and semiconductor Nb:SrTiO3 was observed while the applied bias is close to the height of Schottky barrier. It can be understood that the magnetocrystalline anisotropy of the epitaxial Fe3O4 film significantly modifies the transport of electrons across the interface and leads to the sinusoidal four-fold and six-fold symmetric AMR, where the symmetry is consistent with that of the magnetocrystalline anisotropy of epitaxial Fe3O4 films.
Keywords/Search Tags:epitaxial Fe3O4 films, antiphase boundaries, spin injection, Schottky barrier, anisotropic magnetoresistance
PDF Full Text Request
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