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Vanadate Crystal And Thin Film Growth, Structure And Performance Research

Posted on:2007-06-27Degree:DoctorType:Dissertation
Country:ChinaCandidate:H X LiFull Text:PDF
GTID:1111360185482175Subject:Materials science
Abstract/Summary:PDF Full Text Request
With the development of science and technology, a new field of optoelectronics named integrated optics is being exploited based on the optics, laser and electronics. Simply, the called integrated optics integrate the functions like oscillation, amplification, transmission, coupling, frequency conversion and modulation of relative light wave together to realize the integration and miniaturization of optics components. In the integrated loop, it is convenient to deal with the light wave using the properties of waveguide. Nowadays, as the fundamental components of integrated loop, there are two kinds of medium waveguide: thin films and fibers. The former often applies to integrated loop and the latter to long-travel transmission. A solid-state laser material with waveguide structure has several advantages over the bulk crystal due to its optical confinement which results in low-threshold, highly efficient oscillation and good integration. So, waveguide film has been paid much attention due to its advantages.The main focus of optical waveguide was concentrated on the preparation of waveguide structure. The key factor to get high quality optical waveguide film was to improve experimental method and optimize experimental conditions. In this dissertation, we not only report the growth, structure analysis and thermal properties of new laser crystalsYbVO4 and Er:YbVO4, but also the preparation of several vanadate waveguide films on different substrates by PLD technique. Properties of waveguide films were measured with different analyses techniques, and main contents of the dissertation are as follows:1. Introduce the classical waveguide theory briefly and concisely. Based on the linear optical model, the basic concepts and technical terms of film waveguide theory were given. Different measurement equipments including surface profiler, Rutherford back scattering, X-ray photoelectron spectrum, X-ray diffraction, atomic force microscope, scanning electron microscope and prism coupler were used to analyze the prepared films.
Keywords/Search Tags:pulsed laser deposition, optical waveguide films, oxygen pressure, substrate temperature, surface morphology, effective index refractive
PDF Full Text Request
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