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Positron defect mapping

Posted on:2009-02-25Degree:Ph.DType:Dissertation
University:Idaho State UniversityCandidate:Gagliardi, Marcus AFull Text:PDF
GTID:1441390005958121Subject:Physics
Abstract/Summary:
Positron annihilation spectroscopy has been used in the detection of monovacancies as well as dislocations in materials for many years. Using the technique of Doppler broadening, relative defect density measurements were made on several copper coupons that had been annealed as well as shot peened. Due to its nature, shot peening introduces defects such as monovacancies and dislocations into the material. This reproducible technique was used to implant these defects into the copper in order to show that correlations exist between S-parameter and shot peening intensity. Relative defect density maps were produced that allow for verification to be made of different defect density regions. Also, these relative defect density maps can be used to determine if shot peening intensity was uniform over the measured area.
Keywords/Search Tags:Defect, Shot peening, Used
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