Vertical beam emittance correction with independent component analysis measurement method | | Posted on:2009-03-12 | Degree:Ph.D | Type:Dissertation | | University:Indiana University | Candidate:Wang, Fei | Full Text:PDF | | GTID:1448390002493413 | Subject:Physics | | Abstract/Summary: | PDF Full Text Request | | The storage ring performance is determined by the vertical beam size, that is by the vertical emittance, which is determined by two factors: the vertical dispersion generated in the bending magnets, and the coupling of the oscillations in the vertical and horizontal plane. In this dissertation, a detailed study of the main source of the vertical emittance and effective correction methods are presented.;Simulations show that the vertical emittance is dominated by the contribution due to photon emission with non-zero vertical dispersion in bending magnets. An effective method to make vertical dispersion correction is to analysis the harmonics of the vertical dispersion and to eliminate the largest components of the stopband integral with harmonics near the vertical betatron tune. A stopband correction scheme is being implemented in which the excitation of skew-quadrupole correctors is determined from measurements of the resonance strengths (stopband widths) of major resonances. This method can correct the vertical dispersion function and the coupling strength simultaneously without identifying the source of errors. Studies show the coupling strength and the vertical dispersion can be controlled individually in the quadruple-bend achromatic low emittance lattice. Resulting improvement in machine performance is that the equilibrium vertical emittance is reduced by the factor of 7.;Effective correction depends on precise beam measurements. Independent component analysis for BPM turn-by-turn data has shown the potential to be a useful tool for diagnostics and optics verification. The effectiveness of employing the independent component analysis (ICA) method to measure the vertical dispersion function is studied. This method for extracting the beta function and phase advance for the beam position monitors is presented. The accuracy of optical functions thus calculated is affected by different factors in a different manner. The most influent factors on the accuracy are discussed through simulation studies of the quadrupole-bend achromatic lattice. | | Keywords/Search Tags: | Vertical, Emittance, Independent component analysis, Beam, Correction, Method | PDF Full Text Request | Related items |
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