A study of the factors effecting layer thickness uniformity and layer breakup in microlayered coextruded films

Microlayer coextrusion offers the opportunity to economically commercialize the production of nanometer thick film. A major obstacle towards commercialization is the non-uniform thickness of these layers and their breakup into droplets, which is also known as a scattering instability. Prior research had indicated a strong interaction between material properties and process parameters. Therefore, the focus of this research effort was to better understand and then identify the coextrusion parameters and material properties that governed the layer non-uniformity and scattering.; Initial studies had indicated that there existed an interaction between the two extruders, which gave rise to pressure fluctuations and non-uniform flow. The interaction of the two extruders was studied by analyzing the pressure signals at the two extruders and the junction of the two streams. A response surface method was used to analyze the two extruders individually, the number of layer multiplying elements and finally the interaction between the two extruders and the effect they had on pressure, surging, flow rate and torque. Although the interaction of the two extruders did result in higher backpressures, it did not decrease the output. The output was independent of the screw speed of the other extruder, however it did influence the melting mechanics along the screw. The more shear sensitive PMMA showed a greater degree of sensitivity than the Newtonian PC.; The influence of primary; coextrusion, and secondary; chill roll, processing on the final layer thickness was studied in a second set of experiments. For this purpose primary coextrusion process parameters such as screw speed ratio, die temperature and core melt temperature were changed and the effect on the layer thickness uniformity was studied. Similarly secondary process parameters such as nip gap and chill roll speed were also investigated. Thickness was measured using an Atomic Force Microscope (AFM). The screw speed ratio was the most important primary process variable in controlling the layer thickness. Chill roll velocity was an important process variable used to control layer thickness. These two process parameters also showed the greatest layer uniformity at screw speed ratios of unity and very high chill roll speeds.; Researchers have speculated that scattering is controlled by the same factors that governs droplet breakup in blend systems. The primary factors identified by them were the thickness of the layers, the interfacial tension and the number of layers. A 23 level full factorial DOE was carried out and the thickness of the samples measured using FMM. (Abstract shortened by UMI.)...