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Solution-based deposition of ultrathin metal oxide films on metal and superconductor surfaces

Posted on:2005-12-06Degree:Ph.DType:Dissertation
University:University of Illinois at Urbana-ChampaignCandidate:Westwood, GlennFull Text:PDF
GTID:1451390008980841Subject:Chemistry
Abstract/Summary:
Solution chemical methods were used to deposit ultrathin metal oxide films on metal and superconductor surfaces. Platinum-molybdenum oxide films were deposited by spontaneous adsorption and electrodeposition of hexamolybdoplatinate, PtMO6O248-. Spectroscopic characterization by 17O and 195Pt NMR showed that the PtMo6O248- anion is stable in aqueous solution below pH 4. The interaction of this solution stable anion with Au and Ag was characterized by in situ scanning tunneling microscopy, x-ray photoelectron spectroscopy, and cyclic voltammetry. The anion was partially reduced upon adsorption on Ag, but spontaneously adsorbed on Au to form an amorphous surface phase. The electrodeposition of hexamolybdoplatinate on Au electrodes resulted in an electrode surface that was different from the spontaneously adsorbed species, in terms of composition, voltammetry, and reactivity. Cyclic voltammetry was also used to compare the reactivity of these materials for the electrooxidation of methanol.; Ultrathin zirconia films were deposited on YBa2Cu3O 7-delta by alternating exposures to tetra n-propyl zirconate, Zr4(OPrn)16, and H2O in n-propanol. Physical and chemical characterization of these films was done by x-ray photoelectron spectroscopy, atomic force microscopy, and cross-section transmission electron microscopy. The zirconia films were determined to be ultrathin (<10 nm) and highly conformal to the surface of YBa2Cu3O7-delta. Metal-insulator-superconductor tunnel junctions fabricated in this fashion were characterized by current-voltage and conductivity-voltage measurements.; Solution deposition from Zr4(OPrn) 16 was also used to deposit ultrathin zirconia films on gold, silver, and aluminum surfaces. X-ray photoelectron spectroscopy and atomic force microscopy were used to compare the physical properties of these films. Electrical measurements showed that zirconia films on Ag and Au are not insulating, but aluminum-zirconia-aluminum capacitors fabricated by this method displayed capacitance densities between 0.09 tauo 0.50 muF/cm2 (tan delta = 0.09 to 1.12) and current densities between 10-2 to 10-4 A/cm2.
Keywords/Search Tags:Films, Ultrathin, Metal, Surface, Solution, X-ray photoelectron spectroscopy, Used
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