AFM and imaging XPS data correlation

This research is focused on developing new methods for the non-destructive, three-dimensional characterization of heterogeneous polymeric samples. Data is acquired from polymer blend samples using X-ray Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM), and Laser Scanning Confocal Microscopy (LSCM). This multi-technique approach will provide a more complete picture of the sample under study than results from a single technique alone. This research is part of an effort to develop a comprehensive image analysis system that integrates data from different techniques into a realistic three-dimensional model visualizing structure and morphology in multicomponent heterogeneous samples.; A new approach to correlating AFM and imaging XPS data is developed. AFM provides both topographical and phase contrast information on the nanometer scale, but phase identification can be ambiguous. Imaging XPS provides elemental and chemical information on the micron scale. A method to chemically identify the observed phases in AFM by quantitative XPS imaging is outlined. Correlating the data from both techniques involves resizing, image alignment, resolution matching, and classification methods. The approach is applied to a patterned polymer surface of known properties for validation and then to heterogeneous polymer blends for phase identification. In addition, a method is outlined for the fusion of data acquired from polymer blends using imaging XPS, AFM, and LSCM.