Analysis of electron-ion coincidence data to elucidate molecular dynamics of dissociation processes induced by soft x-ray synchrotron radiation

Dissociation processes following excitation or ionization of an inner-shell electron of a molecule are studied by the electron-ion-ion coincidence technique. The data set of an electron-ion-ion coincidence experiment is inherently large. The pattern of noise is different from that found in other data acquisition methods. The object of this project is to analyze the characteristics of the electron-ion-ion coincidence data and develop methods to reveal as much information as possible.