| This dissertation develops a framework for interpreting the fracture resistance of thin adhesive layers. Both fracture at the boundary between the adhesive and the adherends and fracture within the adhesive are considered. A testing protocol for simultaneously measuring values of the fracture parameters G, J, and C* is developed. A criterion to ensure the accuracy of C* measurements is derived, analogous to the Hutchinson-Paris ω criterion. The fracture resistance of an adhesive system used by the Boeing Company is characterized according to this framework across a range of temperatures and crack growth rates. |
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