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Stabilizing electronic components to ensure passage of the toxicity characteristic leaching procedure

Posted on:2004-12-27Degree:Ph.DType:Dissertation
University:Tennessee Technological UniversityCandidate:Rogers, Bendell CurtisFull Text:PDF
GTID:1461390011973998Subject:Environmental Sciences
Abstract/Summary:
The rapidly advancing electronic age produces obsolete electronic components daily. In fact, technology now has a doubling rate of every six months. The consequences of such a high obsolescence rate is the generation of million of cubic yards of toxic metal containing electronic components. These components require treatment prior to disposal. Although recycling is possible for a portion of these materials, millions of pounds remain stored in government warehouses awaiting the development and approval of acceptable stabilization techniques. Components containing toxic metals must pass the Toxicity Characteristic Leaching Procedure (TCLP) test or be subjected to treatment standards so that they pass the TCLP test prior to disposal.; All computer circuit boards contain toxic metals. Included among these toxic metals are silver, mercury, arsenic, cadmium, lead, beryllium, thallium, antimony, chromium, selenium, barium, and nickel. The TCLP test subjects a sample to an acid leach. If the sample leaches quantities of metals in excess of prescribed limits it must be treated such that it passes the test. Title 40 Code of Federal Regulation (CFR) Part 268.40 must be met if the waste form is to be placed in a licensed disposal facility. Without an acceptable treatment some waste could remain in perpetual storage.; A stabilization media was selected and a sample preparation technique was specified, designed, subjected to the rigors of EPA's TCLP test, and evaluated. The media of choice prevents the leaching of toxic metals from stabilized waste thus meeting the requirements of Title 40 CFR §268.40.
Keywords/Search Tags:Electronic components, Toxic, Leaching, TCLP test
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