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Growth of crystalline alumina and titanium-oxynitride thin films by metalorganic chemical vapor deposition

Posted on:2004-01-08Degree:Ph.DType:Dissertation
University:University of KentuckyCandidate:Pradhan, Siddhartha KumarFull Text:PDF
GTID:1461390011976626Subject:Engineering
Abstract/Summary:
Crystalline Al2O3 films and Ti-oxynitride (TiO xNy) films have been deposited by metalorganic chemical vapor deposition (MOCVD). These films were developed for potential use as wear-resistant coatings for cutting tools. Aluminum acetylacetonate was used as the precursor material for the deposition of Al2O3 films. Mostly amorphous film was deposited below 750°C. With increase in deposition temperature, crystallinity of the film increased—a strong ⟨011⟩ textured κ-Al 2O3 film was deposited at 950°C. In the absence of water vapor, the Al2O3 film growth rate increased with increase in temperature whereas in the presence of water vapor, the growth rate was higher and decreased with increase in temperature. TiOxNy film with isomorphous TiN structure was deposited using titanium tetraisopropoxide and NH3. XRD analysis of the film deposited on Si(111) and mica substrates at 600°C revealed a (111) TiOxNy peak and TiO2 (rutile) peaks. At low temperatures, below 600°C, the deposited films contained only TiO2 (anatase) phase. At 650°C and above, both anatase and rutile TiO2 phases were present. The film growth and morphology depended on precursor, NH3 and diluent gas flow rates. The optimum bubbler and NH3 flow rates under the given processing conditions were about 300–350 sccm. Increase in NH 3 flow at a constant precursor flow resulted in smaller angular clusters, and dilution of the inlet stream resulted in a higher growth rate and an increase in cluster size and angularity. A machining test confirmed that a TiO xNy coated tool insert performs better than an uncoated tool insert. During the MOCVD of TiOxNy films, growth of TiO2 nanorods on a WC-Co substrate at 500°C was discovered. The presence of cobalt on the substrate surface catalyzes the nanorod growth. In a separate study, classical and atomic nucleation theories were used to calculate the nucleation rates of hypothetical Ag deposition on W substrate at various process conditions. It was found that for practical deposition conditions, both theories are equally useful for nucleation rate studies.
Keywords/Search Tags:Tio, Film, Vapor, Growth, Deposited, Rate
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