In situ observation of the domain behaviors in normal and relaxor ferroelectric single crystals under applied electric field and temperature

he domain microstructure in relaxor ferroelectric materials is believed to cause large dielectric and piezoelectric/electrostrictive properties. A CCD camera system was used to examine domain microstructure of relaxor and normal ferroelectric single crystals as a function of temperature and electric field. The in-situ domain wall motions and configurations were observed in real time and recorded on video.;The domain reorientation in these single crystals were compared to understand the relationship of the domain structure and ferroelectric properties. The ;In...