Study On Determination Of Optical Constants And Thickness Of Thin Films By Transmission Spectrum Method

With the increasingly wide application of thin films in many technical fields, the requirements of the thin film technique are being advanced. Consequently, the technical level of thin films has been improved. In practical applications, it is very important to determine the optical characteristic of thin-film coating materials in a wideband range for designing and fabricating the optical thin films with high quality. Because the optical characteristics of thin films are usually different from those of bulk materials and the optical constants of thin films depend on the methods, conditions and parameters of deposition, how to determine the optical constants of thin films precisely and rapidly is being a focused issue for the researchers. Among the methods for determination of the optical constants of thin films, the transmission spectrum method is one of the most favorite methods, because of its merits, such as simplicity of measurement, facility of operation, the wide application and high precision, etc.In this thesis, the transmission spectrum method for determining the optical constants and thickness of thin films has been studied. A method for determining both the optical constants and the thickness of thin films from transmission spectrum has been presented. The experiment was performed and the results were satisfied. The main results obtained in this thesis are as follows:1. The basic theory for determining the optical constants and the thickness of transparent homogeneous films was introduced. The refractive index and thickness of the single-layer ZnS film deposited on the CaF₂ substrate and the...