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Metal/Oxide,Semiconductor/Oxide And Photovoltaic System

Posted on:2006-09-18Degree:MasterType:Thesis
Country:ChinaCandidate:F R ZhangFull Text:PDF
GTID:2121360155970328Subject:Materials science
Abstract/Summary:PDF Full Text Request
The study on multilayers have been developed for last 30 years, as the results of development of surface engineering and films' technique. Multilayers are kinds of artifical layers with alternate deposition. They were accumulated by metal-metal, metal- semiconductor, semiconductor-semiconductor and other materials. At present, the research of artifical multilayers have become an active scientific embranchment of thin films and surface science.This paper mainly expatiates on the development, characteristic of the structure of multilayers and application to solar cells. The main two aspects of my work were carried through as following.Study on multilayers: Al/Al2O3, Cr/Cr2O3 and Si/SiO2 multilayers were fabricated by evaporation and natural or thermal oxidation, then we detected the thickness of the films with weighting method and tested the U-I curve at room temperature and low temperature. Like negative-resistance feature was found. The films' thickness were basically in conformity to those obtained by weighting method; AFM and STM images showed that island structure were found on film surfaces; TEM images showed that there were amoherphous, crystal and poly-crystal in samples of Si films.The second part: The detection for small type photovoltaic systems were performed. We learned the composing of the small type photovoltaic systems, and designed the circuit to testing the U-I curve of solar cells. Then we tested the U-I curve of α-Si and Poly-crystal Si solar cells at different circumstance, detected multilayers' surface appearance, and observed the cross-section image of SEM.
Keywords/Search Tags:Multilayer, Negative-resistance-like feature, U-I curve, Solar cells
PDF Full Text Request
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