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Study Of Mg2(Si,Ti)O4 System Dielectric Ceramics Sintered At Medium Temperature

Posted on:2011-02-12Degree:MasterType:Thesis
Country:ChinaCandidate:X K RenFull Text:PDF
GTID:2131330338983697Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
In this paper, dielectric properties of Mg2(Si,Ti)O4 based low dielectric ceremics materies were studied systematically, such materials can be applied to the electronic circuit as the substrate materials. On the promise of not reduce the dielectric properties , how to reduce the sintering temperature is the key point.We prepared two kind of glass power which were added to Mg2(Si1-xTix)O4 system as sintering additives using high temperature melting and sol-gel method,both of them can decrease the sintering temperature. By discussing the effects of the addition of glass and bismuth oxide with low melting and Si/Ti at B-site on microsture and dielectric properties, revealed some modified basic rules, at the same time ,Mg2(Si,Ti)O4 based dielectric ceremics materies with good dielectric properties sintered at medium temperature were abtained.This article also improved processing route of basic materies, the optimum process is pre-synthesized precursor of Mg2SiO4 and Mg2TiO4 calcined at 1200℃for 2h, then synthesized Mg2(Si1-xTix)O4. Doped 2wt% of glass which prepared by high-temperature melting method to Mg2(Si1-xTix)O4 (x = 0.05,0.1,0.15,0.2), sintered at 1200℃for 2h, the dielectric loss is in the range of 0.00012 0.0002, and with the replacement of Ti on Si at B-site increasing , dielectric constant (ε) of Mg2 (Si1-xTix)O4 ceramic increased, the dielectric constant temperature coefficient (αε) shifted for the negative growth. When Ti content (x) is 0.1, samples have the best dielectric properties at 1MHz:ε= 14.2, tanδ= 1.2×10-4,αε= 1.7×10-6 /℃,ρv = 4.2×1015Ω·cm. Doped 2wt% of glass powder prepared by sol - gel method , with the temperature of heat treating increasing, the activity of powder increased, the density of ceramics improved as well.Doped 2wt% of bismuth oxide, with the holding time increasing (≤6h), loss(tanδ) decreased, but the holding time increased to 8h, the loss (tanδ) increased again, samples sintered at 1280℃for 6h have the best dielectric properties:ε= 14.6, tanδ= 3.6×10-4,αε= 9. 9×10-6 /℃,ρv = 3.1×1015Ω·cm.
Keywords/Search Tags:low dielectric ceremics, Mg2(Si1-xTix)O4, sol-gel method, sintering additives
PDF Full Text Request
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