Improvements And Application In Nanometer Material Science Of AFM.IPC-208B Typed Atomic Force Microscope

The appearing of the first STM in 1982 makes human being be able to observe the arrangement of a single atom on the material's surface, however , it has a lot of limitations that it is only used to observe and research on the surface of conductor and semiconductor, so the AFM had been come out. With the rapid progress in technology during the past more than ten years, AFM establishes its status as a kind of surface analyzed apparatus depending on nanometer-level resolution and unlimited conduction of samples, and its application also attracts more and more attention with the improving of nano-technique .Because of its stabilization, convenient ,the excellent quality of the picture ,people concern more about its application area and industrialization .The paper firstly introduces the development of Atomic Force Microscopy, and the foundational principles of AFM , and then ,make a good expatiate of the whole system of the AFM.IPC-208B developed by Chongqing University. It has brought some suggestions to the problems in development and experiment .Because the probe plays an important role in experiment, the paper emphasizes particularly on its preparation and optimization. In nano-material field, we studied on TiO2 and WO3, and then discussed their microcosmic structure.