| With the increasing of "greenhouse gas", the surface temperature of the world become higher, many countries and regions were subjected to high temperature stress, which have a significant limit the production of rice. High temperature not only to reduced the yield and deteriorate quality trait of rice, but also to change the planted system in rice. Compared with other stresses, the studies on the genetic basis of high temperature tolerance in rice was later. The genetic mechanisms of high temperature tolerance was very complex, the progress of high tolerance breeding was limited. Iimproving the high temperature tolerance of rice variety and enhancing the studied on high temperature tolerance is primary aim for high temperature tolerance in rice. On the other hand, the development of gene chip technology can provided more strategy to the genetic of high temperature tolerance. Understanding the model of expression gene and identifying the stress genes under different stresses or organs by gene chip, it is useful for gene cloning of high temperature tolerance.In this study:1) we have, developed two heterozygous populations derived.from a cross between RIL(T219/T226) and two male sterile lines, Hua201S andⅡ-32A, realized the effect of environment on seed setting ratio (SR), and then treated the two populations under high temperature tolerance in growth chamber during the flowering stage to, assess the genetic effect of quantitative trait loci (QTL) of high temperature tolerance; 2) Investigated and analysis the phenotype of lines of near isogenic lines under different generation and the genetic of BC2F2; 3) Global genome expression analysis in response to drought, high temperature and combination of drought and high temperature stress stresses in flag leaf and panicle of rice, T219 and T226. The main results are summarized as following:1. The result of high temperature treated at flowering stage of T219 and T226 showed that the pollen fertilization showed no different in two rice, but the number of pollen on stigma and the SR of T226 was significant better than that in T219, and we can presume that the reduce of SR under high temperature stress in heading stage was not determined by the pollen fertilization but the number of pollen on the stigma.2. There were evident different in different lines of Hua201S/RIL(T219/T226) population, and the SR of Hua201S/RIL(T219/T226) was better than the population ofⅡ-32A/RIL(T219/T226). It explained that the SR of Hua201S/RIL(T219/T226) was stable under different environment.3. Environments may has effect to the population and the relationship analyses revealed that all of the two populations in different environment condition most evidently correlation together and SR under high temperature stress was positive correlation with their parents in hybrid rice.4. There existed varying degrees of positive or negative to the heterosis advantage among these crosses. For competitive heterosis, means of seed setting ratio was-5.14%, and only 45 of 138 crosses showed positive heterosis,32.61% of proportion. And for over parent heterosis,64 crosses showed positive heterosis, 46.38% of proportion.5. Treated the two populations under high temperature stress in growth chamber and measured high temperature tolerance with the relative ratio of flowering fertilization, and QTLs for high temperature tolerance during flowering stage. There were four main effect were mapped which located in chromosome 4,7,10 and 11, respectively. The varances were 5.01%,8.99%,7.24% and 7.34%, respectively.6. The inheritance analysis of the BC2F2 for NILs, and the result showed that the inheritance of the BC2F2 of the two NILs, qHT2 and qHT3, was accorded with Mendel's law byχ2 test.7. Global genome expression analysis in response to drought, high temperature and combination of drought and high temperature stress stresses in flag leaf and yong panicle of rice, and there were 334,595 and 109 genes for up regulating the expression and 247,57 and 184 gene down regulated, the function of genes were and protected protein and transfer factors...
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