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Research On Fault Injection Of Control And Monitor Program Of Synthetic Aperture Radar

Posted on:2005-04-27Degree:MasterType:Thesis
Country:ChinaCandidate:P ZhuFull Text:PDF
GTID:2168360152455635Subject:Communication and Information System
Abstract/Summary:PDF Full Text Request
Nowadays, the computer system has been used widely, and the reliability of the computer system became more and more important. In the field of aviation, spaceflight and military communication system, the high-dependability is the most important factor of the computer system. In these kinds of systems, once the failure appears, it may cause the fatal loss of economic, military and even political affairs. The conclusion can be drawn that for these kinds of systems, the reliability of the system is very important. As the development of computer system, the use of high-dependability is more and more widely, especially in traffic, finance, watercraft, power generation and so on. However, the high-dependability system is needed in aviation system specially. Fault injection is a kind of important method in the field of dependability testing and assessing of fault tolerant computer.This article focused on the relationship of aerospace single event upset and RAM model, and do particular research on it. In addition, this article brings out a kind of new method of fault injection, which is based on interrupt control and software fault injection. The thesis emphasizes on the fault injector based on DS80C320 microcontroller system. This fault injector based on 80C31 MCU had proved the fault tolerant ability of the space vehicle control and monitor program.The result of the experiments showed that this fault injector based on MCUsystem can simulate the effect of single event upset, and can succeed in fault injection to the system. To compare with other kinds of fault injector, this new method of fault injection have the merits of easy to manipulate and control, real-time fault injection and online analysis.
Keywords/Search Tags:Fault injection, single event upset, microcontroller, interrupt
PDF Full Text Request
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