New Generation High Temperature Dynamic VLSI Burn-in Test Platform Based On Embedded System

With the development of microelectronics and computer science,control microchips become more and more powerful and widely used,which makes embedded system catching our eyes.Meanwhile,with the comprehensive use of semiconductor integrate circuit,the reliability issues become outstanding.As a test method which can eliminate early faults and cause no damage,burn-in test becomes an important means of improving product reliability.Nowadays,because integrate circuit becomes more and more complicated,present burn-in test system can not meet the need.The design of a new generation burn-in test platform is the purpose of this thesis.This design is an upgrade of BTI3000N.It brings embedded technology into burn-in test field,and with the help of programmable ASIC technology it improves performance,reduces programming work and shortens the developing time.The software and hardware are both configurable.So the platform has great versatility and expansibility.It can test kinds of digital or analog electronic parts.It is an origination in this field.In this dissertation,we first introduce the concept of embedded system and burn-in test,also point out the problems we faced.Then we introduce the hardware structure and the features of uClinux.The startup process of the kernel is analyzed in detail. At last we discuss the development of the applications.The main work of this paper could be summarized as follows:1. Brief introduction to the embedded system and burn-in test technology.2. Analysis of the features of uClinux,pointing out the differences between uClinux and Linux and the influence on the application.3. Analysis of the startup process of uClinux and the modification of the kernel.4. Making use of GNU and VC 6.0 to develop administration program.5. Parallel configuration of multiple FPGA.6. Implementation of main control program.