Research And Test Method Of High Voltage PDP Driver IC's Reliability

Power IC, which is a composite result of power electronics and microelectronics, is developing rapidly in global range. As an important part of power IC, High-Voltage (HV) IC integrates HV components and low voltage control circuits on one chip. And it is based on the technology of high voltage components, high voltage semiconductor manufacture process, and corresponding design method.XD100 and XD170 are PDP driver IC's which have our own patent. Testing and analyzing the reliability of driver IC is important to realize commercial production.In this paper, the PDP's display principle and driver method have been introduced firstly, then the PDP's circuit structure and X electrode, Y electrode, A electrode's driver circuit. Energy-recovery driving circuit and the high-voltage output circuit have been analyzed. Then the PDP driver IC XD100 and XD170 have been tested from logic function and DC attribute. Founding on the testing result, the reliability of driver IC have been analyzed by electromigration, latch up, isolation technology, VDMOS reliability and ESD. The VDMOS safe area has been given and second breakdown phenomenon has been analyzed. The way how to avoid the second breakdown phenomenon has been discussed.Finally some method to improve PDP drive IC's reliability have been given.