Fault Diagnose Of Automatic Test System Of Semiconductor

Semiconductor Test is the vital step of the chip production, a hundred percent of chips need to be tested to make sure the quality of all chips. ATS(Automatic Test System)of Semiconductor is the important equipment of the test production, chips are automatically tested by them. They are very dear equipments, so make sure the high rate of utility of them is very vital to the factory.The fault of the ATS is diagnosed by the engineer, the work efficiency of the engineer affect the rate of utility of ATS. They always are the mechanical and electric expert, so for the sake of enhancement the diagnostic ability of interface, I developed the Troubleshooting System of GPIB interface. Troubleshooting System of GPIB interface could show the intern information of interface to the engineer, and could simulate the tester or the handler.The Troubleshooting system contains three modules: interface module; simulate test module; simulate handler module. Interface module could test the interface communication and show the possible fault. Simulate test module could simulate a sort of tester which could communicate with several sort of handler. Simulate handler module could simulate several sort of handler which could communicate with a sort of tester.The intellectualized fault diagnose is the main research direction, The intellectualized fault diagnose based on knowledge is always developed by the expert system. CLIPS are a kind of expert system's programme language, it could programme of based on rules, object oriented, process oriented.I developed a diagnostic programmer to help engineer to diagnose a kind of handler. This need communicating with the engineer and make their experiment to the CLIPS. The main function is diagnosing the starting problem of the handler, come down to power problem, control circuit problem, main computer problem and programme download problem.