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Planar Inspect System Base On CCD Image

Posted on:2008-05-26Degree:MasterType:Thesis
Country:ChinaCandidate:Z F YingFull Text:PDF
GTID:2178360215998605Subject:Optical Engineering
Abstract/Summary:PDF Full Text Request
CCD (Charge Couple Device) is a micro image sensor with photoelectricconversion and signal read out function. Its output signal is usually to bechanged into standard format of television video, and to be storaged in asuitable medium or entered into the computer for the image porcessing.Since the founding of CCD at Bell Labs in 1970s, with the development ofelectronic technology the CCD technology has been developed rapidly, suchas the integration of the pixel CCD sensor, accuracy, sensitivity, resolution,frequency range. High-speed moving objects can be detected through the useof high-speed imaging. Because of its wide spectral response, the highgeometric precision, low noise, small size, light weight, low voltage, shockand vibration resistance, and resistance to electromagnetic interference,strong, durable, long life, no residual images, it has found its applicationin appalling conditions, digital computers, image acquisition, non-contactmeasurement and real-time monitoring.Although because of the CCD technology the measurement system has beenmarkedly improved, many test systems are still in contact situation and somesoft parts can not be accurately measured. Replacing the CMMprobe with a CCDcamera the non-contact size teset system can be realized, and the specialworkpiece detection accuracy can be improved effectively.The system consists of CCD sensor, optical imaging system, dataacquisition and processing system. It has a high measurement precision, speed,flexibility and other convenient features. Using appropriate lighting the 2Ddimensional inspection can be made. In this system the detecting object isimaged onto the CCD target surface. Through the appropriate processingtechnology the geometric and size information of target can be extractedprecisely.
Keywords/Search Tags:CCD, Measurement technology, Image sensor, Image processing, Optics measurement
PDF Full Text Request
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