VLSI Auto Testing And Design For Test

As the rapid development, Integrated circuit technology has become the mainstream of the modern emergying industry. The progress of the new technology make it possible to hold hundred of thousand of transistors in the same IC which is the most popular VLSI (ultra large scale integrated circuit) technology instead of the original one(SSI, small integrated circuit) that only several transistors to be accommodated. This technology allows the complecated system to be integrated on the same chip (system On a Chip, SOC) in such rapid advancement. Thus ASIC (specific integrated circuits), the concept has gradually imprinted in every integrated circuit design engineers'mind. Therefore, wherever in the industry or academic field, IC design has become the electronics, electrical, or even the field of information in one direction.With the increased complexity and size of the circuits shrinking, testing has become an urgent problem to be resolved, particularly when high and deep submicron integrated into the development phase, through various integrated IP, System on Chip (SOC) functions is getting more powerful, meanwhile it brings a series of design and testing problems. Testing is the expensive and difficult section of VLSI design. It is reported that the expence of testing could occupy more than 50% of the manufacturing cost of the chip with the increasing rate of VLSI integration.The market life of product is getting shorter compared to the cycle procedure of design, testing will influence more on the product launching market time and cycle of design.The test has become the key factor of SOC design and application. The essencial SOC problem is caused by the multi-core using. SOC IP module can be used, but the parties Embedded Design for Testability nuclear lack of unified standards. Therefor it is necessary to do nuclear retesting, and the design costs should be controlled as 1/3 of the investment approximatelyTraditional simulation, verification and test method has been difficult to verify the correctness of VLSI circuit design and manufacture. We need rethink that is considered in the design of a test problem started. In tests designed to resolve the thorny issues on the forefront.This paper mainly described Freescale microprocessors, digital IC testing theory and methods. Embedded memory test circuit testing and analysis (testing process and the different activities in different ways, such as verification, simulation, simulation and testing put into test areas so), the basic concepts and theories. Digital IC testing and selection of typical IDDQ testing of built-in self-test and Built-In Self-Test principle is discussed in detail.