| The advantages of fiber communication system is huge-capacity,low-cost, broad-band and low-loss,also the Si-based semiconductor devices have the advantages of mature production technology and low production costs. How to integrate the advantages of both? Developing Si-base Ge Quantum-Dots photodetector used in fiber communication field is the right way.It will prepare for ultra-large-scale optoelectronic integrated communications and future photonic communication.After all it will benefit the mankind.Ultra-High Vacuum Chemical Vapor Deposition(UHV/CVD) System is adopted in this thesis to make a study of Ge quantum dots which is grown on the Si-based with the thermodynamic and kinetic theiry of S-K growth model.After a systematically study,We got the optimal conditions for single-layer growth of Ge quantum dots:Temperature T=550℃;time t =5min;GeH4 flow=lsccm.Then got the optimal growth conditions for multi-layer structure.Final we successfully developed multi-layer PIN structure Ge quantum dots detector material on Si-based.We adopt the traditional semiconductor technology to develop the semiconductor raw material into semiconductor devices.From material cleaning to the device package,lithography with "â… ","â…¡" and "â…¢" Mask version are carried out.SiO2 insulation layer and Al electrode are deposited with dry and wet etching reformation of material surface.At lase we do the test work:Electrical performance and spectral response of the device are measured.Especialy the Photoelectric response test for the Optical Fiber Communication Band(1.33um-1.55um).From the test,we can see that:The functions of the device in line with the basic design;Devices with better characteristics of dark current(0.043mA/W -3V bias);due to lowe Ge-component materials the device show a low Responsiveness as 0.0014mA/W -4V bias in the Photoelectric response test for the Optical Fiber Communication Band(1.33um-1.55um).In the end,the author summarize the experience in the development of the Ge quantum dots optoelectronic devices,and put forward measures to improve the device performance to direct the further work. |